內容：

Improvements in electron microscopy have provided many new opportunities to explore multiple degrees of freedom in condensed matter physics, well beyond the lattice. Now, we can detect every electron scattered by a sample in both real and momentum space. Using these multidimensional data, we can retrieve the scattering potential of the sample [1], regardless of its nature, such as the electrostatic potential from atoms and magnetic field from spin or even quantum states. In this talk, I will show a successful inversion of the long-standing multiple scattering problem, which was established by H. Bethe in the 1920s. A direct outcome of this inversion is that atoms can be imaged at a resolution mainly limited by the lattice vibration [2]. This new technique also allows for precise measurements of the atomic displacements on a sub-pico-meter scale. I will show one typical example of subtle lattice distortions due to strong electron-lattice coupling in a correlated oxide [3]. I will also show that nanoscale topological spin textures can be imaged at a remarkably high sensitivity and resolution [4]. Finally, I will share my views on the impact of state-of-the-art electron microscopy in condensed matter physics. 

 

References

[1] Y. Jiang#, Z. Chen#, et al., Nature 559, 343 (2018).

[2] Z. Chen, et al., Science 372, 826 (2021).

[3] Y. Zhang#, Y. Li#, Z. Chen#*, et al., under review.

[4] Z. Chen*, et al., Nat. Nanotechnol. 17, 1165 (2022).

人物介紹：

2014年于中國科學院物理研究所獲理學博士學位，之后于澳大利亞莫納什大學和美國康奈爾大學做博士后研究，目前為清華大學材料學院北京電子顯微鏡中心副研究員。相關研究工作獲得圖像分辨率吉尼斯世界紀錄和兩院院士評選的2021年世界十大科技進展新聞。入選國家級人才青年項目（優先資助）、MIT Technology Review 2021年度中國區35位35歲以下創新人物，獲得美國顯微學會博士后獎。相關工作以第一作者或通訊作者發表在Nature、Science和Nature Nanotechnology等期刊上。